Hyun-Suk Kim, Tae-Seon Hyun, Ho-Gi Kim, Il-Doo Kim, Tae-Soon Yun, Jong-Chul Lee, “Structural and dielectric properties of epitaxial Ba0.6Sr0.4TiO3 thin films grown on Si substrates with thin SrO buffer layers”,Journal of Electroceramics, vol. 18, 305-309 (2007).,