Joon Seok Park, Tae Sang Kim, Kyoung Seok Son, Eunha Lee, Ji Sim Jung, Kwang-Hee Lee, Wan-Joo Maeng, Hyun-Suk Kim, Eok Su Kim, Kyung-Bae Park, Jang-Yeon Kwon, Myoung Kwan Ryu, and Sang Yoon Lee, “Ti/Cu bilayer electrodes for SiNx-passivated Hf-In-Zn-O thin film transistors: Device performance and contact resistance”, Applied Physics Letters, vol. 97, 162105 (2010).,

Joon Seok Park, Tae Sang Kim, Kyoung Seok Son, Kwang-Hee Lee, Ji Sim Jung, Wan-Joo Maeng, Hyun-Suk Kim, Eok Su Kim, Kyung-Bae Park, Jong-Baek Seon, Jang-Yeon Kwon, Myoung Kwan Ryu, and Sangyun Lee, “High-Performance and Stable Transparent Hf-In-Zn-O Thin Film Transistors with a Double-Etch-Stopper Layer”, IEEE Electron Device Letters, vol. 31, 1248-1250 (2010).,

Hyun-Suk Kim, Kyung-Bae Park, Kyoung Seok Son, Joon Seok Park, Wan-Joo Maeng, Tae Sang Kim, Kwang-Hee Lee, Eok Su Kim, Jiyoul Lee, Joonki Suh, Jong-Baek Seon, Myoung Kwan Ryu, Sang Yoon Lee, Kimoon Lee, and Seongil Im, “The influence of sputtering power and O2/Ar flow ratio on the performance and stability of Hf-In-Zn-O thin film transistors under illumination”, Applied Physics Letters, vol. 97, 102103 (2010).,

Joon Seok Park, Kyoung Seok Son, Tae Sang Kim, Ji Sim Jung, Kwang-Hee Lee, Wan-Joo Maeng, Hyun-Suk Kim, Eok Su Kim, Kyung-Bae Park, Jong-Baek Seon, Jang-Yeon Kwon, Myoung Kwan Ryu, and Sangyun Lee, “High Performance and Stability of Double-Gate Hf-In-Zn-O Thin Film Transistors under Illumination”, IEEE Electron Device Letters, vol. 31, 960-962 (2010).,

Hyun-Suk Kim, Lei Bi, Hanjong Paik, Dae-Jin Yang, Yun Chang Park, G. F. Dionne, and Caroline Ross, “Self-assembled single-phase perovskite nanocomposite thin films”, Nano Letters, vol. 10, 597-602 (2010) [IF = 13.779].,

Lei Bi, Hyun-Suk Kim, G. F. Dionne, and C. A. Ross, “Structure, magnetic properties and magnetoelastic anisotropy in epitaxial Sr(Ti1-xCox)O3films”,New Journal of Physics, vol. 12, 043044 (2010).,

Joon Seok Park, Tae Sang Kim, Kyoung Seok Son, Kwang-Hee Lee, Wan-Joo Maeng, Hyun-Suk Kim, Eok Su Kim, Kyung-Bae Park, Jong-Baek Seon, WoongChoi, Myoung Kwan Ryu, and Sangyun Lee, “The Influence of SiOx and SiNx Passivation on the Negative Bias Stability of Hf-In-Zn-O Thin Film Transistors under Illumination”,Applied Physics Letters, vol. 96, 262109 (2010).,