SungHun Woo, TaeHo Shin, Hyunil Kang Wonseok Choi, Hyun-Suk Kim, Junghyun Kim*, “Phase Synthesis and Electrochemical Characteristics of Non-stoichiometric Sm1-xBa0.5Sr0.5Co2O5+d Layered Perovskite for IT-SOFC Cathodes”, New & Renewable Energy, vol. 15, 81-89 (2019) [SCOPUS].,

Jong Hyun Kang, Ju Young Kim, Yejin Jo, Hyun-Suk Kim, Sungmook Jung, Su Yeon Lee, Youngmin Choi, and Sunho Jeong*, “Three-Dimensionally Printed Pressure Sensor Arrays from Hysteresis-Less Stretchable Piezoresistive Composites”, RSC Advances, vol. 9, 39993-40002,

Jong Heon Kim, Cheng-Fan Xiao, Kwangmo Go, Kyungjin Lee, Hyun-Suk Kim*, “The effect of substrate roughness on the fabrication and performance of all-solid-state thin-film lithium-ion battery”, J. Korean Inst. Electr. Electron. Mater. Eng., vol. 32, 437-443 (2019).,

Song-Yi Ahn, Kyung Park, Daehwan Choi, Jozeph Park, Yong Joo Kim, and Hyun-Suk Kim*, “A Study on the Transition of Copper Oxide by the Incorporation of Nitrogen”, Electronics, vol. 8, 1099 (2019).,

Hyoung-Do Kim, Hae-Won Lee, S.V.N Pammi, Sung Woo Lee, Soon-Gil Yoon, Jozeph Park, Yong Joo Kim, and Hyun-Suk Kim*, “Comparative study of hybrid Perovskite phototransistors based on CVD-grown and spin-coated MAPbI3”, Journal of Alloys and Compounds, vol. 815, 152404 (2019).,

Shuai Ning, Samuel C. Huberman, Zhiwei Ding, Ho-Hyun Nahm, Yong-Hyun Kim, Hyun-Suk Kim, Gang Chen, and Caroline A. Ross*, “Anomalous Defect Dependence of Thermal Conductivity in Epitaxial WO3 Thin Films”, Advanced Materials, vol. 2019, 1903738 (2019).,

Hyoung-Do Kim, Hyun-Suk Kim*, “Highly Stable Thin-Film Transistors Based on Amorphous Perovskite Semiconductors”, SID Symposium Digest of Technical Papers, vol. 50, 1337-1340 (2019).,

Seong Cheol Jang, Jozeph Park, Hyoung-Do Kim, Hyunmin Hong, Kwun-Bum Chung*, Yong Joo Kim*, and Hyun-Suk Kim*, *corresponding author, “Low temperature activation of amorphous In-Ga-Zn-O semiconductors using microwave and e-beam radiation, and the associated thin film transistor properties”, AIP Advances, vol. 9, 025204 (2019)..,

Kyung Park, Jong-Heon Kim, Hyun-Woo Park, Ju-Heyuck Baeck, Jonguk Bae, Kwon-Shik Park, Inbyeong Kang, Kwun-Bum Chung, Hyun-Suk Kim*, and Jang-Yeon Kwon*, *corresponding author, “Highly Reliable Amorphous In-Ga-Zn-O Thin Film Transistors Through the Addition of Nitrogen Doping”, IEEE Transactions on Electron Devices vol. 66, 457-463 (2019) [IF = 2.620].,